文献
J-GLOBAL ID:200902297182749910
整理番号:06A0655201
ビスマス層状構造誘電体における誘電特性の厚み依存性
Thickness dependence of dielectric properties in bismuth layer-structured dielectrics
著者 (9件):
TAKAHASHI Kenji
(Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502, JPN)
,
SUZUKI Muneyasu
(Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502, JPN)
,
KOJIMA Takashi
(Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502, JPN)
,
WATANABE Takayuki
(Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502 ...)
,
SAKASHITA Yukio
(TDK Corp., 570-2 Matsugashita, Minamihatori, Narita-shi, Chiba 286-8588, JPN)
,
KATO Kazumi
(National Inst. of Advanced Industrial Sci. and Technol., 2266-98 Anagahora, Shimoshidami, Moriyama-ku, Nagoya ...)
,
SAKATA Osami
(Materials Sci. Div., Japan Synchrotron Radiation Res. Inst. (JASRI)/SPring-8, Kouto, Mikazuki, Sayo, Hyogo 679-5198, JPN)
,
SUMITANI Kazushi
(Materials Sci. Div., Japan Synchrotron Radiation Res. Inst. (JASRI)/SPring-8, Kouto, Mikazuki, Sayo, Hyogo 679-5198, JPN)
,
FUNAKUBO Hiroshi
(Dep. of Innovative and Engineered Materials, Tokyo Inst. of Technol., 4259 Nagatsuta, Midori-ku, Yokohama 226-8502 ...)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
89
号:
8
ページ:
082901-082901-3
発行年:
2006年08月21日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)