文献
J-GLOBAL ID:201102293819623160
整理番号:11A1568595
スケーラブルTaN金属ソース/ドレイン&ゲートInGaAs/Ge系n/pMOSFET
Scalable TaN Metal Source/Drain & Gate InGaAs/Ge n/pMOSFETs
著者 (11件):
MAEDA T.
(National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
URABE Y.
(National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
ITATANI T.
(National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
ISHII H.
(National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
MIYATA N.
(National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
YASUDA T.
(National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN)
,
YAMADA H.
(Sumitomo Chemical Co. Ltd., Ibaraki, JPN)
,
HATA M.
(Sumitomo Chemical Co. Ltd., Ibaraki, JPN)
,
YOKOYAMA M.
(Univ. Tokyo, Tokyo, JPN)
,
TAKENAKA M.
(Univ. Tokyo, Tokyo, JPN)
,
TAKAGI S.
(Univ. Tokyo, Tokyo, JPN)
資料名:
Digest of Technical Papers. Symposium on VLSI Technology
(Digest of Technical Papers. Symposium on VLSI Technology)
巻:
2011
ページ:
62-63
発行年:
2011年
JST資料番号:
A0035B
ISSN:
0743-1562
資料種別:
会議録 (C)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)