文献
J-GLOBAL ID:201402253752266988
整理番号:14A0618772
ナノメータテクノロジーの複数入力ゲート用のオーバーシュート効果の効果的モデル
An Effective Model of the Overshooting Effect for Multiple-Input Gates in Nanometer Technologies
著者 (5件):
DING Li
(Graduate School of Information, Production and Systems, Waseda Univ.)
,
HUANG Zhangcai
(Graduate School of Information, Production and Systems, Waseda Univ.)
,
KUROKAWA Atsushi
(Graduate School of Information, Production and Systems, Waseda Univ.)
,
WANG Jing
(Graduate School of Information, Production and Systems, Waseda Univ.)
,
INOUE Yasuaki
(Graduate School of Information, Production and Systems, Waseda Univ.)
資料名:
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences (Web)
(IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences (Web))
巻:
E97.A
号:
5
ページ:
1059-1074 (J-STAGE)
発行年:
2014年
JST資料番号:
U0466A
ISSN:
1745-1337
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
日本 (JPN)
言語:
英語 (EN)