文献
J-GLOBAL ID:201602250137560307
整理番号:16A0911520
化学気相堆積中の高周波バイアス電圧印加に伴う水素化非晶質炭化シリコンの化学構造の変化
Changes of chemical structure of hydrogenated amorphous silicon carbide films with the application of radio-frequency bias voltages during chemical vapor deposition
著者 (7件):
Ito Haruhiko
(Department of Chemistry, Nagaoka University of Technology, Nagaoka 940-2188, Japan)
,
Ogaki Takeshi
(Department of Chemistry, Nagaoka University of Technology, Nagaoka 940-2188, Japan)
,
Kumakura Motoki
(Department of Chemistry, Nagaoka University of Technology, Nagaoka 940-2188, Japan)
,
Saeki Shunsuke
(Department of Chemistry, Nagaoka University of Technology, Nagaoka 940-2188, Japan)
,
Suzuki Tsuneo
(Extreme Energy-Density Research Institute of Nagaoka University of Technology, Nagaoka 940-2188, Japan)
,
Akasaka Hiroki
(Department of Chemistry, Nagaoka University of Technology, Nagaoka 940-2188, Japan)
,
Saitoh Hidetoshi
(Department of Chemistry, Nagaoka University of Technology, Nagaoka 940-2188, Japan)
資料名:
Diamond and Related Materials
(Diamond and Related Materials)
巻:
66
ページ:
1-9
発行年:
2016年06月
JST資料番号:
W0498A
ISSN:
0925-9635
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)