文献
J-GLOBAL ID:201602260477932734
整理番号:16A1340889
単結晶ダイヤモンド表面の集束イオンビーム誘発損傷層の除去と特性解析及び多種多様な深さパターン形成への応用
Removal and characterization of focused-ion-beam-induced damaged layer on single crystal diamond surface and application to multiple depth patterning
著者 (6件):
Kawasegi Noritaka
(Central Research Institute, Toyama Industrial Technology Center, 150 Futagami-machi, Takaoka-shi, Toyama 933-0981, Japan)
,
Kuroda Seiya
(Faculty of Engineering, University of Toyama, 3190 Gofuku, Toyama 930-8555, Japan)
,
Morita Noboru
(Graduate School of Engineering, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba-shi, Chiba 263-8522, Japan)
,
Nishimura Kazuhito
(Faculty of Engineering, Kogakuin University, 2665-1 Nakano-machi, Hachioji-shi, Tokyo 192-0015, Japan)
,
Yamaguchi Makoto
(Graduate School of Engineering Science, Akita University, 1-1 Tegatagakuen-machi, Akita-shi, Akita 010-8502, Japan)
,
Takano Noboru
(Graduate School of Science and Engineering for Research, University of Toyama, 3190 Gofuku, Toyama 930-8555, Japan)
資料名:
Diamond and Related Materials
(Diamond and Related Materials)
巻:
70
ページ:
159-166
発行年:
2016年11月
JST資料番号:
W0498A
ISSN:
0925-9635
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)