文献
J-GLOBAL ID:201602274374753411
整理番号:16A1098523
ITO薄膜抵抗温度検出器の作製と特性評価【Powered by NICT】
Fabrication and characterization of ITO thin film resistance temperature detector
著者 (3件):
Wang Yanlei
(National Key Laboratory of Science and Technology on Micro/Nano Fabrication, Shanghai Jiao Tong University, Shanghai 200240, People’s Republic of China)
,
Zhang Congchun
(National Key Laboratory of Science and Technology on Micro/Nano Fabrication, Shanghai Jiao Tong University, Shanghai 200240, People’s Republic of China)
,
Ding Guifu
(National Key Laboratory of Science and Technology on Micro/Nano Fabrication, Shanghai Jiao Tong University, Shanghai 200240, People’s Republic of China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
INEC
ページ:
1-2
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)