文献
J-GLOBAL ID:201702214897338103
整理番号:17A1728348
Agカルコゲナイドガラスフレキシブル放射線センサ:AgのTID影響側方拡散に及ぼすSeの原子比の影響【Powered by NICT】
Ag-chalcogenide glass flexible radiation sensor: Impact of atomic ratio of Se on the TID influenced lateral diffusion of Ag
著者 (10件):
Mahmud A.
(School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287-5706 USA)
,
Gonzalez-Velo Y.
(School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287-5706 USA)
,
Taggart J.
(School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287-5706 USA)
,
Bamaby H. J.
(School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287-5706 USA)
,
Kozicki M. N.
(School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287-5706 USA)
,
Holbert K. E.
(School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287-5706 USA)
,
Mitkova M.
(Department of Electrical and Computer Engineering, Boise State University, Boise, ID 83725 USA)
,
Alford T. L.
(School for Engineering of Matter, Transport and Energy, Arizona State University, Tempe, AZ 85287-5706 USA)
,
Goryll M.
(School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287-5706 USA)
,
Chen W.
(School of Electrical, Computer and Energy Engineering, Arizona State University, Tempe, AZ 85287-5706 USA)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
RADECS
ページ:
1-3
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)