文献
J-GLOBAL ID:201802230186180813
整理番号:18A0995149
TOF-SIMSと顕微鏡画像の主成分分析画像融合とピクセル還元による低強度二次イオン増強【JST・京大機械翻訳】
Principal component analysis image fusion of TOF-SIMS and microscopic images and low intensity secondary ion enhancement by pixel reduction
著者 (6件):
Takahashi Kazuma
(Department of Materials and Life Science, Seikei University, 3-3-1 Kichijoji-kitamachi, Musashino, Tokyo 180-8633, Japan)
,
Yamagishi Takayuki
(Department of Materials and Life Science, Seikei University, 3-3-1 Kichijoji-kitamachi, Musashino, Tokyo 180-8633, Japan)
,
Aoyagi Satoka
(Department of Materials and Life Science, Seikei University, 3-3-1 Kichijoji-kitamachi, Musashino, Tokyo 180-8633, Japan)
,
Aoki Dan
(Department of Biosphere Resources Science, Graduate School of Bioagricultural Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8601, Japan)
,
Fukushima Kazuhiko
(Department of Biosphere Resources Science, Graduate School of Bioagricultural Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8601, Japan)
,
Kimura Yoshishige
(Department of Liberal Arts and Sciences, Kanagawa University of Human Services, 1-10-1 Heisei-cho, Yokosuka, Kanagawa 238-8522, Japan)
資料名:
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
(Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena)
巻:
36
号:
3
ページ:
03F113-03F113-6
発行年:
2018年
JST資料番号:
E0974A
ISSN:
2166-2746
CODEN:
JVTBD9
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)