文献
J-GLOBAL ID:201902215543789979
整理番号:19A0307573
超低スイッチング損失の5Vゲート電圧により駆動された1200VスケールIGBTの実証【JST・京大機械翻訳】
Demonstration of 1200V Scaled IGBTs Driven by 5V Gate Voltage with Superiorly Low Switching Loss
著者 (23件):
Saraya T.
(The University of Tokyo, Tokyo, Japan)
,
Itou K.
(The University of Tokyo, Tokyo, Japan)
,
Takakura T.
(The University of Tokyo, Tokyo, Japan)
,
Fukui M.
(The University of Tokyo, Tokyo, Japan)
,
Suzuki S.
(The University of Tokyo, Tokyo, Japan)
,
Takeuchi K.
(The University of Tokyo, Tokyo, Japan)
,
Tsukuda M.
(Green Electronics Research Institute, Kitakyushu, Japan)
,
Numasawa Y.
(Meiji University, Kawasaki, Japan)
,
Satoh K.
(Mitsubishi Electric Corp., Fukuoka, Japan)
,
Matsudai T.
(Toshiba Electronic Devices & Storage Corp., Tokyo, Japan)
,
Saito W.
(Toshiba Electronic Devices & Storage Corp., Tokyo, Japan)
,
Kakushima K.
(Tokyo Inst. of Technology, Yokohama, Japan)
,
Hoshii T.
(Tokyo Inst. of Technology, Yokohama, Japan)
,
Furukawa K.
(Tokyo Inst. of Technology, Yokohama, Japan)
,
Watanabe M.
(Tokyo Inst. of Technology, Yokohama, Japan)
,
Shigyo N.
(Tokyo Inst. of Technology, Yokohama, Japan)
,
Tsutsui K.
(Tokyo Inst. of Technology, Yokohama, Japan)
,
Iwai H.
(Tokyo Inst. of Technology, Yokohama, Japan)
,
Ogura A.
(Meiji University, Kawasaki, Japan)
,
Nishizawa S.
(Kyushu University, Fukuoka, Japan)
,
Omura I.
(Kyushu Inst. of Technology, Kitakyushu, Japan)
,
Ohashi H.
(Tokyo Inst. of Technology, Yokohama, Japan)
,
Hiramoto T.
(The University of Tokyo, Tokyo, Japan)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
IEDM
ページ:
8.4.1-8.4.4
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)