文献
J-GLOBAL ID:201902220985180408
整理番号:19A2560191
DC測定システムのための7ppm INLとサブ100μHz 1/fコーナーを持つ22ビット読出しIC【JST・京大機械翻訳】
A 22-bit Read-Out IC With 7-ppm INL and Sub-100- $¥mu$ Hz 1/ $f$ Corner for DC Measurement Systems
著者 (4件):
Jun Jaehoon
(Department of Electrical Engineering and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea)
,
Park Soungchul
(Department of Electrical Engineering and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea)
,
Kang Junho
(Department of Electrical Engineering and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea)
,
Kim Suhwan
(Department of Electrical Engineering and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea)
資料名:
IEEE Journal of Solid-State Circuits
(IEEE Journal of Solid-State Circuits)
巻:
54
号:
11
ページ:
3086-3096
発行年:
2019年
JST資料番号:
B0761A
ISSN:
0018-9200
CODEN:
IJSCBC
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)