文献
J-GLOBAL ID:201902225248196729
整理番号:19A1836538
β-FeSi_2ナノ膜における歪分布評価のための二次元X線回折スポットの形状適合解析【JST・京大機械翻訳】
Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a β-FeSi2 nanofilm
著者 (10件):
Takemoto Shohei
(Graduate School of Science and Technology, Nara Institute of Science and Technology (NAIST), Takayama 8916-5, Ikoma, Nara 630-0192, Japan)
,
Hattori Ken
(Graduate School of Science and Technology, Nara Institute of Science and Technology (NAIST), Takayama 8916-5, Ikoma, Nara 630-0192, Japan)
,
Someta Masaaki
(Graduate School of Science and Technology, Nara Institute of Science and Technology (NAIST), Takayama 8916-5, Ikoma, Nara 630-0192, Japan)
,
Hattori Azusa N.
(Nanoscience and Nanotechnology Center, Institute of Scientific and Industrial Research (ISIR), Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan)
,
Hattori Azusa N.
(JST-PRESTO, Honcho 4-1-8, Kawaguchi, Saitama 332-0012, Japan)
,
Tanaka Hidekazu
(Nanoscience and Nanotechnology Center, Institute of Scientific and Industrial Research (ISIR), Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567-0047, Japan)
,
Kurushima Kosuke
(Toray Research Center Incorporated (TRC), Sonoyama 3-3-7, Otsu, Shiga 520-8567, Japan)
,
Otsuka Yuji
(Toray Research Center Incorporated (TRC), Sonoyama 3-3-7, Otsu, Shiga 520-8567, Japan)
,
Daimon Hiroshi
(Graduate School of Science and Technology, Nara Institute of Science and Technology (NAIST), Takayama 8916-5, Ikoma, Nara 630-0192, Japan)
,
Daimon Hiroshi
(Data Science Center, Nara Institute of Science and Technology (NAIST), Takayama 8916-5, Ikoma, Nara 630-0192, Japan)
資料名:
Journal of Applied Crystallography
(Journal of Applied Crystallography)
巻:
52
号:
4
ページ:
732-744
発行年:
2019年
JST資料番号:
D0631A
ISSN:
0021-8898
CODEN:
JACGAR
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)