文献
J-GLOBAL ID:201902265245560430
整理番号:19A0189717
室温で動作する電気移動直列接続ナノギャップにおける多重接合単一Electron充電【JST・京大機械翻訳】
Multiple-Junction Single-Electron Charging in Electromigrated Series-Connected Nanogaps Operating at Room Temperature
著者 (4件):
Ito Mitsuki
(Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology, Koganei, Tokyo, 184-8588, Japan)
,
Shimada Moe
(Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology, Koganei, Tokyo, 184-8588, Japan)
,
Yagi Mamiko
(Department of Engineering for Future Innovation, National Institute of Technology, Ichinoseki College, Ichinoseki, Iwate, 021-8511, Japan)
,
Shirakashi Jun-Ichi
(Department of Electrical and Electronic Engineering, Tokyo University of Agriculture and Technology, Koganei, Tokyo, 184-8588, Japan)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2018
号:
NMDC
ページ:
1-4
発行年:
2018年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)