文献
J-GLOBAL ID:201902268697136541
整理番号:19A1696448
回転補償器偏光解析を用いた垂直対物型偏光解析顕微鏡法によるギャップ形状測定の補正法の検証
Validation of correction method for gap shape measurement by vertical-objective-type ellipsometric microscopy with rotating-compensator ellipsometry
著者 (5件):
NAMBA Katsuya
(Department of Micro-Nano Mechanical Science and Engineering, Nagoya University)
,
SASAO Yusuke
(Department of Micro-Nano Mechanical Science and Engineering, Nagoya University)
,
FUKUZAWA Kenji
(Department of Micro-Nano Mechanical Science and Engineering, Nagoya University)
,
ITOH Shintaro
(Department of Micro-Nano Mechanical Science and Engineering, Nagoya University)
,
ZHANG Hedong
(Department of Complex Systems Science, Nagoya University)
資料名:
Journal of Advanced Mechanical Design, Systems, and Manufacturing (Web)
(Journal of Advanced Mechanical Design, Systems, and Manufacturing (Web))
巻:
13
号:
2
ページ:
JAMDSM0025(J-STAGE)
発行年:
2019年
JST資料番号:
U0027A
ISSN:
1881-3054
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
日本 (JPN)
言語:
英語 (EN)