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著者 (51件)：
資料名：
巻： 38 号： 6 ページ： 063208-063208-15 発行年： 2020年
JST資料番号： C0789B ISSN： 0734-2101 CODEN： JVTAD6 資料種別： 逐次刊行物 (A)
記事区分： 原著論文 発行国： アメリカ合衆国 (USA) 言語： 英語 (EN)
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J-GLOBAL ID：202002226372242207
整理番号：20A2710161
低密度ポリエチレンを用いたX線光電子分光法装置の強度キャリブレーションに関する先進材料および標準研究室間研究に関するVersaillesプロジェクト【JST・京大機械翻訳】
Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene
Reed Benjamen P.
(National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom)
,
Cant David J. H.
(National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom)
,
Spencer Steve J.
(National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom)
,
Carmona-Carmona Abraham Jorge
(CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico)
,
Bushell Adam
(Thermo Fisher Scientific (Surface Analysis), East Grinstead RH19 1XZ, United Kingdom)
,
Herrera-Gomez Alberto
(CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico)
,
Kurokawa Akira
(National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan)
,
Thissen Andreas
(SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin, Germany)
,
Thomas Andrew G.
(School of Materials, Photon Science Institute and Sir Henry Royce Institute, Alan Turing Building, University of Manchester, Oxford Road, Manchester M13 9PL, United Kingdom)
,
Britton Andrew J.
(Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom)
,
Bernasik Andrzej
(Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Krakow, Poland)
,
Fuchs Anne
(Robert Bosch GmbH, Robert-Bosch-Campus, 71272 Renningen, Germany)
,
Baddorf Arthur P.
(Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Road, Oak Ridge, Tennessee 37830)
,
Bock Bernd
(Tascon GmbH, Mendelstr. 17, D-48149 Muenster, Germany)
,
Theilacker Bill
(Medtronic, 710 Medtronic Parkway, LT240, Fridley, Minnesota 55432)
,
Cheng Bin
(Analysis and Testing Center, Beijing University of Chemical Technology, Beijing 100029, People’s Republic of China)
,
Castner David G.
(National ESCA and Surface Analysis Center for Biomedical Problems, Department of Bioengineering and Chemical Engineering, University of Washington, Seattle, Washington 98195)
,
Morgan David J.
(Cardiff Catalysis Institute, School of Chemistry, Cardiff University, Main Building, Cardiff CF10 3AT, United Kingdom)
,
Valley David
(Physical Electronics Inc., East Chanhassen, Minnesota 55317)
,
Willneff Elizabeth A.
(Versatile X-ray Spectroscopy Facility, School of Design, University of Leeds, Leeds LS2 9JT, United Kingdom)
,
Smith Emily F.
(Nanoscale and Microscale Research Centre, University of Nottingham, Nottingham NG7 2RD, United Kingdom)
,
Nolot Emmanuel
(CEA-LETI, 17 rue des Martyrs, 38054 Grenoble, France)
,
Xie Fangyan
(Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People’s Republic of China)
,
Zorn Gilad
(GE Research, 1 Research Circle, K1 1D7A, Niskayuna, New York 12309)
,
Smith Graham C.
(Faculty of Science and Engineering, University of Chester, Thornton Science Park, Chester CH2 4NU, United Kingdom)
,
Yasufuku Hideyuki
(Materials Analysis Station, National Institute for Materials Science (NIMS), 1-2-1 Sengen, Tsukuba, Ibaraki 305-0044, Japan)
,
Fenton Jeffery L.
(Medtronic, 6700 Shingle Creek Parkway, Brooklyn Center, Minnesota 55430)
,
Chen Jian
(Instrumental Analysis & Research Center, Sun Yat-sen University, Guangzhou 510275, People’s Republic of China)
,
Counsell Jonathan D. P.
(Kratos Analytical Ltd., Wharfside, Trafford Wharf Road, Manchester M17 1GP, United Kingdom)
,
Radnik Jorg
(Bundesanstalt fuer Materialforschung und -pruefung (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany)
,
Gaskell Karen J.
(Department of Chemistry and Biochemistry, University of Maryland, College Park, Maryland 20742)
,
Artyushkova Kateryna
(Physical Electronics Inc., East Chanhassen, Minnesota 55317)
,
Yang Li
(Department of Chemistry, Xi’an Jiaotong-Liverpool University, 111 Ren’ai Road, Suzhou Dushu Lake Science and Education Innovation District, Suzhou Industrial Park, Suzhou 215123, People’s Republic of China)
,
Zhang Lulu
(National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan)
,
Eguchi Makiho
(Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan)
,
Walker Marc
(Department of Physics, University of Warwick, Coventry, West Midlands CV4 7AL, United Kingdom)
,
Hajdyla Mariusz
(Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Krakow, Poland)
,
Marzec Mateusz M.
(Academic Centre for Materials and Nanotechnology, AGH University of Science and Technology, 30-059 Krakow, Poland)
,
Linford Matthew R.
(Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602)
,
Kubota Naoyoshi
(Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan)
,
Cortazar-Martinez Orlando
(CINVESTAV-Unidad Queretaro, Queretaro 76230, Mexico)
,
Dietrich Paul
(SPECS Surface Nano Analysis GmbH, Voltastrasse 5, 13355 Berlin, Germany)
,
Satoh Riki
(Analysis Department, Materials Characterization Division, Futtsu Unit, Nippon Steel Technology Co. Ltd., 20-1 Shintomi, Futtsu City, Chiba 293-0011, Japan)
,
Schroeder Sven L. M.
(Versatile X-ray Spectroscopy Facility, School of Chemical and Process Engineering, University of Leeds, Leeds LS2 9JT, United Kingdom)
,
Avval Tahereh G.
(Department of Chemistry and Biochemistry, Brigham Young University, C100 BNSN, Provo, Utah 84602)
,
Nagatomi Takaharu
(Platform Laboratory for Science and Technology, Asahi Kasei Corporation, 2-1 Samejima, Fuji, Shizuoka 416-8501, Japan)
,
Fernandez Vincent
(Universite de Nantes, CNRS, Institut des Materiaux Jean Rouxel, IMN, F-44000 Nantes, France)
,
Lake Wayne
(Atomic Weapons Establishment (AWE), Aldermaston, Reading, Berkshire RG7 4PR, United Kingdom)
,
Azuma Yasushi
(National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan)
,
Yoshikawa Yusuke
(Material Analysis Department, Yazaki Research and Technology Center, Yazaki Corporation, 1500 Mishuku, Susono-city, Shizuoka 410-1194, Japan)
,
Shard Alexander G.
(National Physical Laboratory, Hampton Road, Teddington TW11 0LW, United Kingdom)
資料名：
Journal of Vacuum Science & Technology. A. Vacuum, Surfaces and Films
(Journal of Vacuum Science & Technology. A. Vacuum, Surfaces and Films)
巻： 38 号： 6 ページ： 063208-063208-15 発行年： 2020年
JST資料番号： C0789B ISSN： 0734-2101 CODEN： JVTAD6 資料種別： 逐次刊行物 (A)
記事区分： 原著論文 発行国： アメリカ合衆国 (USA) 言語： 英語 (EN)
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※初めてご利用される方は、JDreamⅢ複写サービスのご案内をご覧ください。