文献
J-GLOBAL ID:202002227079574403
整理番号:20A1905780
ボトムトラッキング:原子間力顕微鏡における周波数シフトの底を保つことの可能性と物理的意味
Bottom-tracking: the possibilities and physical meaning of keeping the bottom of the frequency shift in atomic force microscopy
著者 (9件):
Damiron Denis
(Centre for Interdisciplinary Research on Micro-Nano Methods, Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 153-8505, Japan)
,
Damiron Denis
(LIMMS CNRS-IIS/UTOKYO UMI 2820, Tokyo, 153-8505, Japan)
,
Allain Pierre E.
(Centre for Interdisciplinary Research on Micro-Nano Methods, Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 153-8505, Japan)
,
Allain Pierre E.
(LIMMS CNRS-IIS/UTOKYO UMI 2820, Tokyo, 153-8505, Japan)
,
Allain Pierre E.
(Materiaux et Phenomenes Quantiques, Universite de Paris and CNRS, 75013 Paris, France)
,
Kobayashi Dai
(Centre for Interdisciplinary Research on Micro-Nano Methods, Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 153-8505, Japan)
,
Sasaki Naruo
(The University of Electro-Communications, Chofu, Tokyo 182-8585, Japan)
,
Kawakatsu Hideki
(Centre for Interdisciplinary Research on Micro-Nano Methods, Institute of Industrial Science, The University of Tokyo, Komaba, Tokyo 153-8505, Japan)
,
Kawakatsu Hideki
(LIMMS CNRS-IIS/UTOKYO UMI 2820, Tokyo, 153-8505, Japan)
資料名:
Japanese Journal of Applied Physics
(Japanese Journal of Applied Physics)
巻:
59
号:
SN
ページ:
SN1012 (6pp)
発行年:
2020年08月
JST資料番号:
G0520B
ISSN:
0021-4922
CODEN:
JJAPB6
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)