文献
J-GLOBAL ID:202002275517336494
整理番号:20A1884567
Raman分光法による歪グラフェンの結晶学的配向を決定するための改良法
Improved method for determining crystallographic orientation of strained graphene by Raman spectroscopy
著者 (4件):
Tomori Hikari
(Department of Physics, Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan)
,
Tomori Hikari
(International Center for Materials Nanoarchitectonics, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044, Japan)
,
Nakamura Kazushi
(Department of Physics, Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan)
,
Kanda Akinobu
(Department of Physics, Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8571, Japan)
資料名:
Applied Physics Express
(Applied Physics Express)
巻:
13
号:
7
ページ:
075006 (4pp)
発行年:
2020年07月
JST資料番号:
F0599C
ISSN:
1882-0778
CODEN:
APEPC4
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
イギリス (GBR)
言語:
英語 (EN)