Research field (5):
Crystal engineering
, Applied materials
, Material fabrication and microstructure control
, Thin-film surfaces and interfaces
, Applied physics - general
Research keywords (12):
ultrasonic atomic force microscopy
, scanning probe microscopy
, high temperatuer ultrasonic measurement
, couplant-free ultrasonic measurement
, point contact ultrasonic probe
, air coupled ultrasonic probe
, large amplitude ultrtasonic probe
, trace moisture sensor
, hydrogen sensor
, gas chroomatograph
, ball surface acoustic wave (SAW) sensor
, Material evaluation
The Japanese Society for Non-desteructive Inspection
, The Japan Society of Applied Physics