Research field (6):
Control and systems engineering
, Sensitivity (kansei) informatics
, Soft computing
, Intelligent robotics
, Perceptual information processing
, Intelligent informatics
Research keywords (11):
information hiding
, テキストマインニング
, データマインニング
, パターン認識
, 知識抽出
, 機械学習と理解
, text mining
, data mining
, pattern recognition
, knowledge acquisition
, machine learning and understanding
Research theme for competitive and other funds (5):
2011 - 2012 Development of a new technology for card user authentication based on media hiding
2009 - 2011 画像変更技術に基づくカードホルダ認証
2007 - 2009 パターン間類似度に基づく不完全データからの知識学習と理解に関する研究
2007 - 2007 複数文書の集合内における、文書類似度の算出と可視化の手法に関する共同開発
Knowledge learning and understanding from incomplete data based on pattern similarity
Neural Network Trees with Nodes of Limited Inputs are Good for Learning and Understanding. Proc. 4th Asia-Pacific Conference on Simulated Evolution And Learning (SEAL2002), pp. 573-576. 2002
- 1988 Tohoku University Graduate School, Division of Engineering Department of Electronics
- 1982 Shandong University Faculty of Information Science Computer Science
Professional career (2):
Doctor of Engineering
Master of Engineering
Work history (5):
1999 - 現在 : Professor of the University of Aizu
1995 - 1999 : Associate professor of the University of Aizu
1993 - 1995 : Associate professor of Tohoku University
1991 - 1993 : Associate professor of Beijing Institute of Techonolgy
1988 - 1991 : Post doctoral fellow in Beijing Institute of Technology
Committee career (12):
SICE Member
IPS Member
IEEE Member
IEICE Member
JNNS Member
INNS Member
SICE Member
IPS Member
JNNS Member
IEICE Member
INNS Member
IEEE Member
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Awards (4):
2016/04 - International Conference on Advanced Information Technologies Best Paper Award On the efficiency and efficacy of NNC-Trees for Intrusion Detection
2015/09 - IEEE SMC Society Best Paper Award Aware system, aware unit, and aware logic
2012/07 - International Conference on Machine Learning and Cybernetics Lotfi Zadeh Best Paper Award NNC+SVM: An empirical study for fast classification