Rchr
J-GLOBAL ID：200901082710463365
Update date: Dec. 18, 2024
Yoshida Kiyokazu
ヨシダ キヨカズ | Yoshida Kiyokazu
Affiliation and department：
Research field (2)：
Control and systems engineering
, Electronic devices and equipment
Research keywords (2)：
電子顕微鏡学
, Electron Microscopy
Research theme for competitive and other funds (5)：
- 超高圧電子顕微鏡の通信遠隔操作
- 超高圧電子顕微鏡の性能向上
- 超高圧電子顕微鏡用並列検出方式EELSの開発
- Development of remote operation system for UHVEM
- Design of parallel detection EELS for UHVEM
MISC (72)：
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Design of a Remote Control System for the 3MV Electron Microscope with a Software Operation Panel. Proc. 16th Inter. Conf. on Electron Microscopy, 2006, Sapporo. 2006. 1064CD
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Design of a High Precision Tilting Apparatus for Electron Tomography with the 3MV HVEM. Proc. 16th Inter. Conf. on Electron Microscopy, 2006, Sapporo. 2006. 1146CD
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Three-Dimensional Analysis of Large Scale Models of the Cerebellar Glomerulus Geometry Using Thick Section by Electron Microscopic Tomography. Proc. 16th Inter. Conf. on Electron Microscopy, 2006, Sapporo. 2006. 0706CD
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Microscopic Tomography with Ultra-HVEM and Applications. Proc. 16th Inter. Conf. on Electron Microscopy, 2006, Sapporo. 2006. 0680CD
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Design of a High Precision Tilting Apparatus for Electron Tomography with the 3MV HVEM. Proc. 4th Inter. Cong. on Electron Tomography, 2006, San diego. 2006. p 69
ｍore...
Patents (3)：
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Apparatus for measuring electron beam intensity and electron microscope comprising the same
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日本国特許 特許番号 特許第3125045号 電子線強度測定装置および電子顕微鏡
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United States Patent Patent Number 6078046 Apparatus for measuring electron beam intensity and electron microscope comprising the same
Professional career (1)：
Awards (1)：
Association Membership(s) (2)：
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