Y. Seino, M. Abe, S. Morita(eds, S. V. Kalinin, B. Goldberg, L. M. Eng, D. Huey. Atomically Resolved Imaging of Epitaxial CaF2 on Si (111) Using Noncontact Atomic Foce Microscope. Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials.(Mater. Res. Soc. Symp. Proc., 838E, Warrendale, PA). 2005. O1. 9. 1-6
Ritsumeikan University Institute of Science and Engineering College of Science and Engineering, Department of Physical Sciences, Institute of Science and Engineering College of Science and Engineering Department of Physical Sciences Assistant Professor