ARAI Masayuki

アライマサユキ | ARAI Masayuki

Affiliation and department：
Job title： Professor

Research field (4)： Social systems engineering , Communication and network engineering , Computer systems , Safety engineering

Research keywords (3)： VLSI design and test , dependable network systems , dependable computing

Research theme for competitive and other funds (7)：

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Papers (121)：

Natsuki Ota, Toshinori Hosokawa, Koji Yamazaki, Yukari Yamauchi, Masayuki Arai. An Estimation Method of Defect Types Using Artificial Neural Networks and Fault Detection Information. IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2023). 2023
Yuki Yamanaka, Masayuki Arai, Yoshikazu Nagamura, Satoshi Fukumoto. Toward Improvement and Evaluation of Reconstruction Capability of CapsNet-Based Wafer Map Defect Pattern Classifier. THE 7TH IEEE INTERNATIONAL TEST CONFERENCE IN ASIA (ITC-ASIA) 2023. 2023
Takashi Toyama, Mamoru Ohara, Masayuki Arai, Satoshi Fukumoto. Reliability Evaluation of Cloud-Based Railway Signalling Systems,Using COTS-Based Asynchronous Processing. The 10th Asia-Pacific International Symposium on Advanced Reliability and Maintenance. 2022
Itsuki Fujita, Yoshikazu Nagamura, Masayuki Arai, Satoshi Fukumoto. Note on CapsNet-Based Wafer Map Defect Pattern Classification. Proceedings of IEEE Asian Test Symposium. 2021. 採録決定. 37-42
Natsuki Ohta, Toshinori Hosokawa, Koji Yamazaki, Yukari Yamauchi and Masayuki Arai. An Estimation Method of Defect Types for Suspected Logical Faulty Lines Using Artificial Neural Networks and Fault Detection Information of Universal Logical Fault Model. Proceedings of IEEE Workshop on RTL and High Level Test (WRTLT 2021). 2021. 23-28

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Patents (7)：

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Lectures and oral presentations (71)：

確率モデルによるCOTSベースクラウド型鉄道信号システムの信頼性・安全性評価
(組込み技術とネットワークに関するワークショップ (ETNET2024) 2024)
擬似ブール最適化を用いた2サイクルゲート網羅故障のための低消費電力指向複数目標故障テスト生成法
(電子情報通信学会ディペンダブルコンピューティング研究会 2024)
CapsNetによるウェハマップ欠陥パターン分類精度の改善
(電子情報通信学会ディペンダブルコンピューティング研究会 2024)
ブートストラップ法を用いたウェハマップ欠陥パターン分類におけるラベリングの評価
(電子情報通信学会ディペンダブルコンピューティング研究会(Winter Workshop on Safety) 2023)
組込み自己テストにおける両立可能故障集合を用いた複数ランダムパターンレジスタント故障のシード生成法
(電子情報通信学会ディペンダブルコンピューティング研究会(Winter Workshop on Safety) 2023)

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Education (4)：

1999 - 2001 Tokyo Metropolitan University Graduate School of Engineering Department of Electrical Engineering
1999 - 2001 Tokyo Metropolitan University Graduate School of Engineering Department of Electrical Engineering
1995 - 1999 Tokyo Metropolitan University Faculty of Engineering Department of Electronics and Information Engineering
1995 - 1999 Tokyo Metropolitan University Faculty of Engineering Department of Electronics and Information Engineering

Work history (7)：

2021/04 - 現在日本大学生産工学部数理情報工学科教授
2016/04 - 2021/03 日本大学生産工学部数理情報工学科准教授
2013/04 - 2016/03 日本大学生産工学部数理情報工学科助教
2005/04 - 2013/03 Tokyo Metropolitan University Faculty of System Design 助教
2001/04/01 - 2005/03/31 Tokyo Metropolitan University Graduate School of Engineering

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Committee career (6)：

2019/06 - 現在 30th IEEE Asian Test Symposium (ATS 2021) Finance Chair
2019/01 - 現在 21st IEEE Workshop on RTL and High Level Testing (WRTLT 2020) Program Co-Chair
2018/12 - 現在 24th IEEE Pacific Rim International Symposium on Dependable Computing (PRDC 2019) Finance Chair
2018/06 - 現在 IEEE 3rd International Conference in Asia (ITC-Asia 2019) Finance Chair
2018/04 - 現在電子情報通信学会ディペンダブルコンピューティング研究専門委員会幹事

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Awards (10)：

2022/11 - The 22nd IEEE Workshop on RTL and High Level Testing (WRTLT 2021 ) Best Paper Award
2022/11 - 電子情報通信学会ディペンダブルコンピューティング研究会 2021年度最優秀講演賞
2022/11 - IEEE Reliability Society Japan Joint Chapter,Best Paper Award Layout Feature Extraction Using CNN Classification in Root Cause Analysis of LSI Defects
2021/11 - 電子情報通信学会ディペンダブルコンピューティング研究会 2020年度最優秀講演賞
2021/03 - IEEE Transactions on Semiconductor Manufacturing Best Paper Award - Honorable Mention

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Association Membership(s) (2)：

電子情報通信学会 , IEEE

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