Research keywords (8):
DFT
, Test
, LSI
, LSI Testing and Diagnosis
, Field Testing
, Low Power Testing
, Reconfigurable Computing
, Dependability Computing
Research theme for competitive and other funds (8):
2023 - 2026 Field Testing for Structure-Oriented Computing Architectures
2023 - 2025 Full Life-cycle Reliability Design for Chiplet System
2022 - 2025 Study on the Dependable Intelligent Computing on the Memorism Programmable Processors
2019 - 2023 アダプティブ故障診断における故障診断時間の短縮に関する研究
2019 - 2023 つながるデバイスのフィールドテストのための信頼性強化設計法の開発
2019 - 2023 IoT環境におけるエッジデバイスでの劣化故障検出及び障害予告技術の開発
2016 - 2020 Research on Test and Diagnosis for Delay Faults by Accurate Delay Fault Simulator
2016 - 2019 Built-In Self Diagnosis for Functional Safety Assurance
Show all
Papers (49):
Hui Xu, Jiuqi Li, Ruijun Ma, Huaguo Liang, Chaoming Liu, Senling Wang, Xiaoqing Wen. A Low Area-Overhead and Low Delay Triple-Node-Upset Self-Recoverable Design Based On Stacked Transistors. IEEE Transactions on Device and Materials Reliability. 2024
Tianming Ni, Fei Li, Qingsong Peng, Senling Wang, Xiaoqing Wen. A Lightweight and Machine-Learning-Resistant PUF framework based on Nonlinear Structure and Obfuscating Challenges. Asian Hardware Oriented Security and Trust Symposium (AsianHOST2023). 2023. in-press
Mu Nie, Wen Jiang, Wankou Yang, Senling Wang, Xiaoqing Wen, Tianming Ni. Enhancing Defect Diagnosis and Localization in Wafer Map Testing through Weakly Supervised Learning. Proc. of the 32nd IEEE Asian Test Symposium. 2023
Senling Wang, Shaoqi Wei, Jun Ma, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi, Akihiro Shimizu, Xiaoqing Wen, Tianming Ni. SASL-JTAG: A Light-Weight Dependable JTAG. Proc. of the 36th IEEE Int'l Symp. on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. 2023. paper 6.1
Xihong ZHOU, Senling WANG, Yoshinobu HIGAMI, Hiroshi TAKAHASHI. Testing and Delay-Monitoring for the High Reliability of Memory-based Programmable Logic Device. IEICE TRANSACTIONS on Information and Systems. 2023. E106-D. 10
Three Dimensional Integration of Semiconductors
Springer International Publishing Switzerland 2015 ISBN:9783319186740
Lectures and oral presentations (6):
Automotive Functional Safety Assurance with Multi-cycle POST
(The 1st Workshop on Emerging Test Technologies Workshop on Automotive Functional Safety (ETT-FuSa'23) 2023)
Security Threats and Countermeasures for Cyber-Physical Systems
(Japan Boundary Scan Working Group- FY2022 2022)
A Survey on JTAG Security Threats and Countermeasures
(2021)
Remoting the embedded system development exercises by utilizing a simulator
(2020)
Virtual practice of embedded system development using CAD tools
(2020)
2011 - 2014 Kyushu Institute of Technology Graduate School of Computer Science and Systems Engineering Doctoral Course(Japanese Government Scholarships)
2009 - 2011 Kyushu Institute of Technology Graduate School of Computer Science and Systems Engineering Department of Computer Science and Electronics Master's Course
Professional career (1):
博士 (九州工業大学)
Work history (5):
2020/04 - 現在 Niihama National College of Technology
2019/12 - 現在 Ehime University Faculty of Engineering
2019/04 - 現在 National Institute of Technology, Niihama College Department of Environmental Materials Engineering Lecturer (part-time)
2017/04 - 現在 Ehime University Dept. of Computer Science Senior Assistant Professor
2014/04 - 2017/03 Ehime University Graduate School of Scicence and Engineering Assistant Prof.