Rchr
J-GLOBAL ID:201601017025670241
Update date: Oct. 09, 2024
Shintani Michihiro
シンタニ ミチヒロ | Shintani Michihiro
Affiliation and department:
Job title:
Associate Professor
Homepage URL (1):
https://sites.google.com/view/shintanimichihiro/
Research field (1):
Computer systems
Research theme for competitive and other funds (9):
- 2023 - 2026 Development of fast self regulating digital active gate driver for SiC MOSFET
- 2022 - 2025 スケーラブルな高集積量子誤り訂正システムの開発
- 2022 - 2025 Memcapacitor-based Reliable Brain-morphic Computer Design Platform
- 2018 - 2024 超スマート社会実現のカギを握る革新的半導体技術を基盤としたエネルギーイノベーションの創出
- 2022 - 2024 薄膜メムデバイスとスパイキング計算を用いるニューロモーフィックシステム
- 2018 - 2021 Study on high reliability of neuromorphic hardware
- 2019 - 2020 チップID生成回路の効率的な認証情報の取得と機械学習攻撃耐性の向上に関する研究
- 2019 - 2020 統計学と機械学習を用いた効率的な再利用FPGAの検出に関する研究
- 2015 - 2018 Study on high reliable processor based on mitigation and observation of aging
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Papers (121):
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Takumi Takehisa, Takehiro Takahashi, Jun Furuta, Michihiro Shintani, Kazutoshi Kobayashi. A Multilevel Gate Driver Operating with a Single Voltage Supply and Simple Control Signals for Monolithic Integration of Power GaN HEMT. IEEE Energy Conversion Congress and Exposition (ECCE). 2024
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Ryosuke Matsuo, Kazuhisa Ogawa, Hidehisa Shiomi, Makoto Negoro, Ryutaro Ohira, Takefumi Miyoshi, Michihiro Shintani, Hiromitsu Awano, Takashi Sato, Jun Shiomi. Square-wave defined pulse generator for high fidelity gate operation of superconducting qubits. IEEE International Conference on Quantum Computing and Engineering (QCE). 2024. 378-379
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Michihiro Shintani, Takashi Sato. (Invited) Redefining Outliers for On-Wafer Electrical Testing. ACM/IEEE International Symposium on Machine Learning for CAD (MLCAD). 2024. 1-7
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Yuma Ishisaki, Reon Oshio, Takumi Kuwahara, Michihiro Shintani, Eisuke Tokumitsu, Tokiyoshi Matsuda, Hidenori Kawanishi, Yasuhiko Nakashima, Mutsumi Kimura. Analog Memcapacitor by Ferroelectric Capacitor and Its Application to Spiking Neuromorphic System. IEEE Transactions on Electron Devices. 2024. 71. 8. 4626-4630
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Riaz-ul-haque Mian, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michihiro Shintani. Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing. IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. 2024. E107.A. 8. 1139-1150
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MISC (26):
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新谷道広. エッジAIによる集積回路検査の高精度化と高効率化の両立(招待講演). エッジAI イニシアチブ 2024. 2024
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Michihiro Shintani. Future prospective of our community. What we can do and what we should do?. IEEE Asian Test Symposium (ATS). 2021
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Michihiro Shintani. Recycled FPGA detection using exhaustive fingerprinting characterization (Invited). The 15th D2T Symposium. 2020
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新谷道広. 統計学・機械学習を用いた集積回路検査の効率化と高精度化(招待講演). 一般社団法人 電子情報技術産業協会(JEITA)エネルギーマネージメント・材料デバイス技術分科会. 2020
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新谷道広. 電気と熱の同時解析のポイント、モデルのパラメーターをデバイスに合わせる. パワーデバイスを安心・安全に使う勘所, 日経xTech. 2020
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Work history (7):
Awards (6):
- 2023/06 - キオクシア株式会社 キオクシア奨励研究 優秀研究賞
- 2020/11 - 電子情報通信学会 ディペンダブルコンピューティング研究会 2019年度 研究会最優秀講演賞
- 2016/10 - SASIMI2016 Outstanding paper award
- 2014/12 - IEEE関西支部 第11回IEEE関西支部学生研究奨励賞
- 2013/03 - IEICE VLD Excellent Student Author Award for ASP-DAC 2013
- 2004/11 - IEEE Workshop on RTL and High Level Testing IEEE WRTLT 2004 Best Paper Award A Test Compression Algorithm for Reducing Test Application Time
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