Former Institution / Organization Tohoku University Institute of Multidisciplinary Research for Advanced Materials Center for Advanced Microscopy and Spectroscopy
About Former Institution / Organization Tohoku University Institute of Multidisciplinary Research for Advanced Materials Center for Advanced Microscopy and Spectroscopy
OGATA Yoichiro, TSUDA Kenji, TANAKA Michiyoshi. Charge Density Analysis of Silicon using Convergent-Beam Electron Diffraction. Materia Japan. 2006. 45. 12. 885-885
Space Group Determinations of LaGa1-xMgxO3-x/2 using Convergent-Beam Electron Diffraction. Proceedings of the 16th International Microscopy Congress (IMC16),. 2006. ,1479
Charge Density Analysis of Silicon using Convergent-Beam Electron Diffraction. Proceedings of the 16th International Microscopy Congress (IMC16),. 2006. ,1016