Rchr
J-GLOBAL ID:200901070565172618   Update date: Sep. 24, 2024

Uraoka Yukiharu

ウラオカ ユキハル | Uraoka Yukiharu
Affiliation and department:
Job title: Professor
Homepage URL  (1): http://mswebs.naist.jp/LABs/uraoka/index.html
Research field  (2): Electronic devices and equipment ,  Electric/electronic material engineering
Research keywords  (3): ディスプレイ工学 ,  半導体工学 ,  Semiconductor
Research theme for competitive and other funds  (31):
  • 2022 - 2025 Research on thin film formation technology of metal oxide semiconductors by ALD method aiming at high-performance three-dimensional devices
  • 2022 - 2025 高性能三次元素子を目指したALD法による金属酸化物半導体の薄膜形成技術の研究
  • 2019 - 2022 アモルファス酸化物半導体における熱輸送に着目した高性能フレキシブル熱電素子の研究
  • 2016 - 2022 テキスト解析基盤技術および文書構造解析
  • 2017 - 2019 次世代パワーエレクトロニクス
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Papers (546):
  • Pongsakorn Sihapitak, Juan Paolo Bermundo, Eva Bestelink, Radu A. Sporea, Yukiharu Uraoka. Optimizing a-IGZO Source-Gated Transistor Current by Structure Alteration via TCAD Simulation and Experiment. IEEE Transactions on Electron Devices. 2024. 71. 4. 2431-2437
  • Kaito Hikake, Zhuo Li, Junxiang Hao, Chitra Pandy, Takuya Saraya, Toshiro Hiramoto, Takanori Takahashi, Mutsunori Uenuma, Yukiharu Uraoka, Masaharu Kobayashi. A Nanosheet Oxide Semiconductor FET Using ALD InGaOx Channel for 3-D Integrated Devices. IEEE Transactions on Electron Devices. 2024. 1-7
  • Dianne C. Corsino, Juan Paolo S. Bermundo, Muhammad Arif Razali, Mutsunori Uenuma, Yukiharu Uraoka. Continuous-Wave Green Laser Activation of Transparent InZnO Electrodes for Fully Solution-Processed Oxide Thin-Film Transistors. ACS Applied Electronic Materials. 2023. 5. 11. 5986-5994
  • Umu Hanifah, Juan Paolo S. Bermundo, Hidenori Kawanishi, Magdaleno R. Vasquez, Mark D. Ilasin, Yukiharu Uraoka. Performance and Stability Enhancement of Fully Solution-Processed a-InZnO Thin-Film Transistors via Argon Plasma Treatment. ACS Applied Electronic Materials. 2023. 5. 11. 5872-5884
  • Aimi Syairah Safaruddin, Juan Paolo S. Bermundo, Chuanjun Wu, Mutsunori Uenuma, Atsuko Yamamoto, Mutsumi Kimura, Yukiharu Uraoka. High-k Solution-Processed Barium Titanate/Polysiloxane Nanocomposite for Low-Temperature Ferroelectric Thin-Film Transistors. ACS OMEGA. 2023. 8. 33. 29939-29948
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MISC (252):
  • 夏井葉月, 上沼睦典, 上沼睦典, 富田広人, 橋本由介, 松下智裕, 藤井茉美, 浦岡行治. Evaluation of the Al2O3/GaN interface after PMA treatment by photoelectron holography. 応用物理学会秋季学術講演会講演予稿集(CD-ROM). 2023. 84th
  • 吉井大陸, 藤井茉美, 上沼睦典, 浦岡行治. The dependence of hydrogen plasma etching on diamond crystal orientation. 応用物理学会秋季学術講演会講演予稿集(CD-ROM). 2022. 83rd
  • Purnawati Diki, Regonia Paul Rossener, Regonia Paul Rossener, Bermundo Juan Paolo, Ikeda Kazushi, Uraoka Yukiharu. 31-2: Student Paper: Fermi Level Prediction of Solution-processed Ultra-wide Band gap a-Ga2Ox via Supervised Machine Learning Models. Digest of Technical Papers. SID International Symposium (Society for Information Display). 2022. 53. 1
  • PURNAWATI Diki, REGONIA Paul Rossener, BERMUNDO Juan Paolo, IKEDA Kazushi, URAOKA Yukiharu. Fermi Level Prediction of Solution-processed Ultra-wide Bandgap Amorphous Gallium Oxide via Supervised Machine Learning Models. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2022. 69th
  • QUINO Candell Grace Paredes, BERMUNDO Juan Paolo, UENUMA Mutsunori, URAOKA Yukiharu. Effect of Aging Time and Fuel Content in Silicon-Tin-Oxide Thin Films Fabricated by Solution Combustion Synthesis. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2022. 69th
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Patents (34):
  • 半導体集積回路の不良検出方法および不良検出装置
  • 配線の信頼性評価用パターンと配線の信頼性評価方法
  • 半導体集積回路の信頼性評価方法および評価装置
  • 信頼性評価用ボードおよびバーンイン装置
  • 半導体集積回路の評価装置及び評価方法
more...
Books (5):
  • Intelligent Nanosystems for Energy, Information and Biological Technologies
    2016
  • バイオナノプロセス
    CMC出版 2008
  • 低温ポリシリコン薄膜トランジスタの開発
    CMC出版 2007
  • 珪素化合物の選定と最適利用技術
    技術情報協会 2006
  • 有機基板上の電子デバイス 低温プロセスと応用展開
    CMC出版 2006
Lectures and oral presentations  (5):
  • Oxide Thin Film Transistors for Flexible Devices
    (IMID 2016 2016)
  • Highly Reliable Oxide Thin Film Transistors for Flexible Devices
    (International Display workshop 2015 2015)
  • Oxide Thin Film Transistors for Flexible Displays
    (The 11th Pacific Rim Conference of Ceramic Societies 2015)
  • Bio-Nano Crystallization of Amorphous Si Thin-Film for MEMS Devices
    (The 15th International Meeting on Information Display 2015)
  • Oxide Thin Film Transistors for Flexible Devices
    (IWFPE 2015 2015)
Works (9):
  • 薄膜多結晶トランジスタ(TFT)
    2001 -
  • プローブカード及びその製造方法(特許)
    1995 -
  • シャープ「太陽電池の高効率化に関する研究」
  • 日新電機「シリコン薄膜を用いたデバイス・プロセス評価に関する研究」
  • 松下電器産業 「バイオナノプロセスを用いた半導体極微構造の作製」
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Education (4):
  • - 1985 Toyohashi University of Technology
  • - 1985 Toyohashi University of Technology
  • - 1983 Toyohashi University of Technology Faculty of Engineering
  • - 1983 Toyohashi University of Technology Faculty of Engineering
Professional career (1):
  • (BLANK)
Work history (6):
  • 2009 - Nara Institute of Science and Technology
  • 1999 - Nara Institute of Science and Technology
  • 1996 - 松下電器産業株式会社 液晶事業部
  • 1995 - 松下電器産業株式会社 液晶開発センター
  • 1994 - 松下電工株式会社 半導体応用技術研究所(社内留学)
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Committee career (8):
  • 2021/07 - 現在 IEEE Editor
  • 2020/04 - 現在 薄膜材料デバイス研究会 組織委委員長
  • 2019/04 - 2021/03 IDW (International Display Workshop) FLEX Commiittee Chair
  • 2018/04 - 2020/03 Japan Society of Applied Physics APEX/JJAP Associate Editor
  • 2016/03 - 2019/04 IEEE Kansai Chair
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Awards (11):
  • 2021/05 - The Society for Information Display SID Epecial Recognition Award For his contributions to the establishment of reliability evaluation techniques, elucidation of deterioration phenomena, and a highly reliable process for polycrystalline and oxide thin-film transistors
  • 2016 - 応用物理学会 フェロー 薄膜トランジスタの高性能化・高信頼性化に関する研究
  • 2013/07 - IEEE Senior Member
  • 2005 - Best Paper Award
  • 2005 - IDW/AD Outstanding Poster Award
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Association Membership(s) (1):
日本応用物理学会
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