Rchr
J-GLOBAL ID:200901075559120624   Update date: Sep. 12, 2024

Miyazaki Hiroyuki

ミヤザキ ヒロユキ | Miyazaki Hiroyuki
Affiliation and department:
Job title: Senior Researcher
Homepage URL  (1): http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=H21834409
Research field  (2): Structural and functional materials ,  Inorganic materials
Research keywords  (11): 靭性 透過電子顕微鏡 ,  強度 ,  放熱材料 構造材料 ,  高熱伝導セラミックス ,  炭化ホウ素 硬質材料 耐熱材料・熱伝導材料 ,  セラミックス 窒化ケイ素 ,  Superplastic ,  Nuclear Materials ,  Crystal Growth ,  Lattice Defects ,  Ceramics
Research theme for competitive and other funds  (8):
  • 1998 - 2000 Effect of Nonstoichiometry on Neutron-Irradiation-Behavior of Spinel
  • 1999 - 1999 Si-C-O系」繊維のアロイングによる微細構造制御と機械的特性
  • 1995 - 1996 Synthesis of Nano-Dispersed Powders for Non-Oxide Composites by Spray Pyrolysis Method
  • 1995 - 1995 Role of Sintering Additives in Si-Ti-C Composites
  • 1995 - セラミックスの微構造と機械的性質
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Papers (63):
  • Hiroyuki Miyazaki, Kouichi Yasuda, Yu-Ichi Yoshizawa. Test method for fracture toughness of monolithic ceramics by indentation fracture (IF) method: Improvement of reliability and international standardization activity. Synthesiology. 2021. 13. 1. 29-44
  • Hiroyuki Miyazaki, Kiyoshi Hirao, Hideki Hyuga. Round-robin exercise on the three- and four-point flexural strength of thin ceramic plates for power modules. International Journal of Applied Ceramic Technology. 2019. 16. 6. 2121-2130
  • Shinji Fukuda, Kazuhiko Shimada, Noriya Izu, Hiroyuki Miyazaki, Shoji Iwakiri, Kiyoshi Hirao. Effects of phosphorus content on generation and growth of cracks in nickel-phosphorus platings owing to thermal cycling. Journal of Materials Science: Materials in Electronics. 2018. 29. 14. 11688-11698
  • Hiroyuki Miyazaki, Hideki Hyuga, Kiyoshi Hirao, Hiroshi Sato, Hiroshi Yamaguchi, Shoji Iwakiri, Hideki Hirotsuru. Accelerated thermal fatigue test of metallized ceramic substrates for SiC power modules by repeated four-point bending. Proceedings of the International Symposium on Power Semiconductor Devices and ICs. 2018. 2018-. 264-267
  • Kiyoshi Hirao, Shinji Fukuda, Hiroyuki Miyazaki, You Zhou, Hideki Hyuga, Shoji Iwakiri. Evaluation of residual thermal stress in Cu metalized silicon nitride substrates by raman spectroscopy. 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018. 2018. 194-196
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MISC (38):
Education (4):
  • - 1991 Tokyo Institute of Technology Interdisciplinary Science and Engineering
  • - 1991 Tokyo Institute of Technology Graduate School, Division of Integrated Science and Engineering Energy Science
  • - 1989 Tokyo Institute of Technology School of Engineering DEAPRTMENT OF INORGANIC MATERIALS
  • - 1989 Tokyo Institute of Technology Faculty of Engineering Inorganic Materials
Professional career (1):
  • Ph. D (Tokyo Institute of Technology)
Work history (6):
  • 2000 - 2001 : 通商産業省工業技術院北海道工業技術研究所主任研究官
  • 2001 - -:独立行政法人 産業技術総合研究所 主任研究員
  • 1991 - 2000 : 東京工業大学無機材料工学科助手
  • 2000 - : Hokkaido National Industrial Research Institute,
  • 1991 - : Tokyo Institute of Technology, Research Associate
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Association Membership(s) (3):
日本セラミックス協会 ,  Atomic Energy Society of Japan ,  Ceramic Society of Japan
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