J-GLOBAL ID:200901087587695568   Update date: Oct. 18, 2010


フルヤ ミキオ | FURUYA Mikio
Affiliation and department:
Research field  (1): Physical properties of metals
Research keywords  (1): surface analysis
Research theme for competitive and other funds  (1):
  • Structure analysis of solid surface by electron spectroscopy
Books (1):
  • Micrometer-Scale Imaging of Native Oxide on Silicon Wafers by Using Scanning Auger Electron Spectroscopy
    American Chemical Society 1997
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