Rchr
J-GLOBAL ID:200901091704780463   Update date: Apr. 02, 2021

Shibata Naoya

シバタ ナオヤ | Shibata Naoya
Affiliation and department:
Job title: 教授
Homepage URL  (1): http://interface.t.u-tokyo.ac.jp/
Research field  (3): Structural and functional materials ,  Inorganic materials ,  Metallic materials
Research keywords  (8): 第一原理計算 ,  セラミックス ,  走査型透過電子顕微鏡 ,  界面 ,  粒界 ,  Scanning Transmission Electron Microscopy ,  Grain boundary ,  Interface
Research theme for competitive and other funds  (6):
  • 2020 - 2025 Development of atomic-resolution magnetic field imaging electron microscopy and its application to interface characterization in magnetic materials
  • 2019 - 2024 19H05785 機能コアの材料科学
  • 2019 - 2024 19H05788 界面機能コア解析
  • 2020 - 2023 Development of low-dose atomic resolution STEM imaging method
  • 2017 - 2022 Atom-by-atom imaging of ion dynamics in nano-structures for materials
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Papers (273):
  • Zheng Wang, Ying Luo, Takashi Hisatomi, Junie Jhon M. Vequizo, Sayaka Suzuki, Shanshan Chen, Mamiko Nakabayashi, Lihua Lin, Zhenhua Pan, Nobuko Kariya, et al. Sequential cocatalyst decoration on BaTaO2N towards highly-active Z-scheme water splitting. Nature Communications. 2021. 12. 1005-1005
  • A Ishizuka, K Ishizuka, R Ishikawa, N Shibata, Y Ikuhara, H Hashiguchi, R Sagawa. Improving the depth resolution of STEM-ADF sectioning by 3D deconvolution. Microscopy. 2021. 70. 2. 241-249
  • Hiroaki Nakade, Eita Tochigi, Bin Feng, Yukio Nezu, Hiromichi Ohta, Naoya Shibata, Yuichi Ikuhara. Fabrication and characterization of tetragonal yttria-stabilized zirconia single-crystalline thin film. Journal of the American Ceramic Society. 2021. 104. 3. 1198-1203
  • Ryo Ishikawa, Riku Tanaka, Shigeyuki Morishita, Yuji Kohno, Hidetaka Sawada, Takuya Sasaki, Masanari Ichikawa, Masashi Hasegawa, Naoya Shibata, Yuichi Ikuhara. Automated geometric aberration correction for large-angle illumination STEM. Ultramicroscopy. 2021. 222. 113215-113215
  • Takehito Seki, Yuichi Ikuhara, Naoya Shibata. Toward quantitative electromagnetic field imaging by differential-phase-contrast scanning transmission electron microscopy. Microscopy. 2021. 70. 1. 148-160
more...
MISC (78):
Lectures and oral presentations  (5):
  • 微分位相コントラストSTEMによる材料・デバイス局所電磁場解析
    (電気学会 電子デバイス研究会 2021)
  • 電子で電子は見えるのか?-電子顕微鏡の挑戦-
    (nano tech 2021特別シンポジウム「常識を疑え、未来のナノテクノロジー」 2020)
  • Development of magnetic-field-free atomic resolution STEM
    (MRS fall meeting 2020 2020)
  • 次世代電子顕微鏡開発の展望と意義
    (日本顕微鏡学会 第63回シンポジウム 2020)
  • 微分位相コントラストSTEM法による材料局所電磁場観察
    (第81回応用物理学会秋季学術講演会 2020)
Professional career (1):
  • 博士(工学) (東京大学)
Awards (11):
  • 2019/06 - 日本セラミックス協会 学術賞
  • 2019/02 - 日本学術振興会賞
  • 2018/10 - Richard M. Fulrath Award
  • 2015/05 - 日本顕微鏡学会 第60回瀬藤賞
  • 2015/03 - 日本金属学会 第73回功績賞
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Association Membership(s) (1):
日本金属学会 日本セラミックス協会 日本顕微鏡学会
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