Research keywords (25):
プラズマ応用科学
, Particle Plasma
, atmospheric pressure plasma
, Diamond
, Carbon nano tube
, C60
, Standardization of Surface Chemical Analysis
, Sputter Depth Profiling
, Sputtering
, Secondary Electron Spectroscopy
, Secondary Electron Generation
, Ion Beam
, Electron Beam
, Mobile Scanning Electron Microscope
, Auger Electron Spectroscopy
, Secondary Ion Mass Spectrometry
, Laser Resonance Ionization Spectroscopy
, Rutherford Backscattering Spectrometry
, Ion Scattering Spectroscopy
, Electron Stimulated Desorption
, Reflection High Energy Electron Diffraction
, Low Energy Electron Diffraction
, Surface Analysis
, Surface Science
, Surface and Interface Science
- 2017/04 - 現在 Surface Analysis Society of Japan Surface Analyst Accreditation Committee, member
- 2017/04 - 現在 Surface Analysis Society of Japan Advisory Committee, member
- 2000/04 - 現在 Surface Analysis Society of Japan Journal of Surface Analysis Editorial Board, member
- 2008/06 - 2018/06 Josho Gakuen Convocation Commitee
- 2000/04 - 2017/03 Surface Analysis Society of Japan Executive Committee, member
- 1997/04 - 2017/03 Surface Analysis Society of Japan Webmaster
- 2014/10 - 2016/09 Department of Electric and Electronic Engineering, Faculty of Science and Technology, Kinki University member, External Evaluation Committee
- 2009/11 - 2012/09 Japan Society for the Promotion of Science, Microbes Analysis 141 Committee member, Secondary Electronic Yield Database Expert Committee
- 2010/06 - 2011/03 Osaka Science and Technology Center, New Materials Center member, ISO/TC201/SC6 Correspondence Committee and Ion Beam WG
- 2010/05 - 2011/03 Japanese Standards Association the International Committee for Standardization of Surface Chemical Analysis, member
- 2006/04 - 2009/03 (独)日本学術振興会 「原子構造体・クラスタービームテクノロジー」に関する先導的研究開発委員会 委員
- 2006/04 - 2009/03 Japan Society for the promotion of Science Member, Committee for Leading Research and Development on Atomic Structures and Cluster Beam Technology
- 2005/04 - 2007/03 National Institute for Materials Science member, National Committee for Countermeasures for Surface Chemical Analysis VAMAS TWA2
- 2004/04 - 2007/03 The Japan Society of Applied Physics member, Kansai Branchi Review Committeee
- 2000/04 - 2007/03 Japanese Standards Association Member of Ion Beam WG and Electron Spectroscopy WG, International Standardization Committee for Surface Chemical Analysis Technology
- 2005/08 - 2006/07 (財)日本規格協会 ISO TR 15969 JIS原案作成委員会分科会 委員
- 2005/08 - 2006/07 Japanese Standards Association member, ISO TR 15969 JIS Original Composition Committee Sub-Committee
- 2003/04 - 2004/03 National Institute of Advanced Industrial Science and Technology member, Committee for the Ultrashallow Impurity Depth Profiling
- 2001/04 - 2002/03 Osaka Science and Technology Center, New Materials Center membert, Committee for Joint Development of International Standards for Depth Profiling of Semicondutors
- 2000/04 - 2002/03 Surface Analysis Society of Japan Chairman of Journal of Surface Analysis Editorial Board
- 2000 - 2002 Surface Analysis Society of Japan vice president
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The Surface Analysis Society of Japan
, The Japan Society of vacuum and Surface Science
, The Mass Spectrometry Society of Japan
, The Physical Society of Japan
, The Japan Society of Applied Physics