Rchr
J-GLOBAL ID:200901097600698143   Update date: Sep. 21, 2022

Fujimoto Toshiyuki

フジモト トシユキ | Fujimoto Toshiyuki
Affiliation and department:
Job title: Deputy Director General
Homepage URL  (1): http://www.aist.go.jp/RESEARCHERDB/cgi-bin/worker_detail.cgi?call=namae&rw_id=T49954079
Research field  (1): Nanomaterials
Papers (69):
  • Jämting, A.K., Lin, H.-L., Fu, W.-E., Weng, H.-F., Misumi, I., Sugawara, K., Gonda, S., Takahashi, K., Takahata, K., Ehara, K., et al. Nanoparticle Characterization-Supplementary Comparison on Nanoparticle Size. Metrologia. 2019. 56. 1A
  • Tomohiro Narukawa, Kazumi Inagaki, Shigehiro Naito, Yanbei Zhu, Shin-ichi Miyashita, Takayoshi Kuroiwa, Akiharu Hioki, Toshiyuki Fujimoto, Koichi Chiba. Assessment of technical problems in the analysis of inorganic elements in squid through proficiency testing. TRAC-TRENDS IN ANALYTICAL CHEMISTRY. 2016. 76. 216-226
  • Kyung Joong Kim, An Soon Kim, Jong Shick Jang, Jung Ki Suh, Thomas Wirth, Vasile-Dan Hodoroaba, Wolfgang Unger, Joyce R. Araujo, Braulio S. Archanjo, Carlos E. Galhardo, et al. CCQM K-129 Measurement of mole fractions of Cu, In, Ga and Se in Cu(In,Ga)Se-2 Films Final Report. METROLOGIA. 2016. 53
  • Kim Kyung Joong, Jang Jong Shik, Kim An Soon, Suh Jung Ki, Chung Yong-Duck, Hodoroaba Vasile-Dan, Wirth Thomas, Unger Wolfgang, Kang Hee Jae, Popov Oleg, et al. CCQM pilot study CCQM-P140: quantitative surface analysis of multi-element alloy films. METROLOGIA. 2015. 52
  • D. Windover, D. L. Gil, Y. Azuma, T. Fujimoto. Determining sample alignment in x-ray reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials. MEASUREMENT SCIENCE AND TECHNOLOGY. 2014. 25. 10
more...
MISC (33):
Professional career (1):
  • 理学博士
Association Membership(s) (3):
The Japan Society for Analytical Chemistry ,  The Chemical Society of Japan ,  Catalysis Society of Japan
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