Naitoh Yoshitaka

ナイトウヨシタカ | Naitoh Yoshitaka

Affiliation and department：
Job title： Assistant Professor

Research field (1)： Thin-film surfaces and interfaces

Research keywords (1)：表面・界面

Research theme for competitive and other funds (10)：

2016 - 2021 Assembly of nanostructure on insulating surfaces and investigation of gas reaction mechanism using atomic force microscopy
2017 - 2020 sensitity enhancement and magnetic interaction for nanomagnetic materials for magnetic resonance force microscopy using ferromagnetic resonance
2015 - 2017 Study of friction phenomena on nanoscale using atomic force microscopy combined with electron microscopy
2014 - 2017 Investigation of surface phonon and local surface proiperties at atomic scale with atomic force microscopy
2013 - 2016 Assembly and charge transfer mechanism of nanostructures on insulator surfaces using atomic force microscopy

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Papers (51)：

Junsuke Yamanishi, Yan Jun Li, Yoshitaka Naitoh, Yasuhiro Sugawara. Nanoscale optical imaging with photoinduced force microscopy in heterodyne amplitude modulation and heterodyne frequency modulation modes. Journal of Photochemistry and Photobiology C: Photochemistry Reviews. 2022. 52. 100532-100532
Junsuke Yamanishi, Hidemasa Yamane, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara. Local spectroscopic imaging of a single quantum dot in photoinduced force microscopy. Applied Physics Letters. 2022. 120. 16. 161601-161601
Ryo Izumi, Yan Jun Li, Yoshitaka Naitoh, Yasuhiro Sugawara. Study of high-low KPFM on a pn-patterned Si surface. Microscopy. 2022. 71. 2. 98-103
Junsuke Yamanishi, Hidemasa Yamane, Yoshitaka Naitoh, Yan Jun Li, Nobuhiko Yokoshi, Tatsuya Kameyama, Seiya Koyama, Tsukasa Torimoto, Hajime Ishihara, Yasuhiro Sugawara. Optical force mapping at the single-nanometre scale. NATURE COMMUNICATIONS. 2021. 12. 1
Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara. Atomic-scale elastic property probed by atomic force microscopy. Comprehensive Nanoscience and Nanotechnology. 2019. 1-5. 33-52

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MISC (1)：

KOBAYASHI Naritaka, LI Yan Jun, NAITOH Yoshitaka, KAGESHIMA Masami, SUGAWARA Yasuhiro. Improvement of the Sensitivity of Phase-Modulation Atomic Force Microscopy using Q-control Technique. Hyomen Kagaku. 2007. 28. 9. 532-535

Education (3)：

- 2000 Tokyo Institute of Technology Interdisciplinary Science and Engineering
- 2000 Tokyo Institute of Technology Graduate School, Division of Integrated Science and Engineering
- 1995 Tokyo Institute of Technology School of Science

Professional career (1)：

Work history (2)：

Association Membership(s) (1)：

日本物理学会

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