Art
J-GLOBAL ID：200902002787135441   Reference number：85A0485551

Measurement of surface topography of magnetic tapes by Mirau interferometry.

Mirau干渉計測による磁気テープの表面形状の測定
Author (3)：
BHUSHAN B

About BHUSHAN B

(IBM Corp., Arizona)

About IBM Corp., Arizona

, 
WYANT J C

About WYANT J C

(Univ. Arizona)

About Univ. Arizona

, 
KOLIOPOULOS C L

About KOLIOPOULOS C L

(Univ. Arizona)

About Univ. Arizona


Material：
Applied Optics  (Lasers, Photonics, and Environmental Optics)

About Applied Optics


Volume： 24  Issue： 10  Page： 1489-1497  Publication year： May. 15, 1985 
JST Material Number： B0026B  ISSN： 1559-128X  CODEN： APOPAI  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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shape measurement

About shape measurement

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Measuring methods and instruments of length,area,cross section,volume,angle 
(AD05020O)

About Measuring methods and instruments of length,area,cross section,volume,angle

,  Interferometry and interferometers 
(BD07070G)

About Interferometry and interferometers

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
干渉計測

About 干渉計測

, 
磁気テープ

About 磁気テープ

, 
表面形状

About 表面形状


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