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J-GLOBAL ID:200902003437084565   Reference number:86A0383977

Dislocation reduction in epitaxial GaAs on Si (100)

Si(100)面上へのGaAsエピタキシャル膜における転位密度の低減
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Volume: 48  Issue: 18  Page: 1223-1225  Publication year: May. 05, 1986 
JST Material Number: H0613A  ISSN: 0003-6951  CODEN: APPLAB  Document type: Article
Article type: 短報  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Lattice defects in semiconductors  ,  Semiconductor thin films 
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