Volume:
1992
Page:
848-853
Publication year:
1992
JST Material Number:
E0211B
ISSN:
1089-3539
Document type:
Proceedings
Article type:
原著論文
Country of issue:
United States (USA)
Language:
ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term Keywords indexed to the article. All keywords is available on JDreamIII(charged). On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
To see more with JDream III (charged).
{{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=93A0155251&from=J-GLOBAL&jstjournalNo=E0211B") }}
JST classification (1):
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices
(NC03040G)
About Measurement,testing and reliability of solid-state devices