Art
J-GLOBAL ID：200902009719813002   Reference number：91A0615757

Kelvin probe force microscopy.

Kelvinプローブ力顕微鏡
Author (3)：
NONNENMACHER M

About NONNENMACHER M

(IBM, New York)

About IBM, New York

, 
O'BOYLE M P

About O'BOYLE M P

(IBM, New York)

About IBM, New York

, 
WICKRAMASINGHE H K

About WICKRAMASINGHE H K

(IBM, New York)

About IBM, New York


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 58  Issue： 25  Page： 2921-2923  Publication year： Jun. 24, 1991 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
contact potential difference

About contact potential difference

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
走査型力顕微鏡

About 走査型力顕微鏡


   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=91A0615757&from=J-GLOBAL&jstjournalNo=H0613A") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Microscopy determination of structures 
(BK01040E)

About Microscopy determination of structures

Terms in the title (1)：
Terms in the title
Keywords automatically extracted from the title.
Kelvinプローブ力顕微鏡

About Kelvinプローブ力顕微鏡


Return to Previous Page

TOP

BOTTOM