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J-GLOBAL ID：200902009719813002   Reference number：91A0615757

Kelvin probe force microscopy.

Kelvinプローブ力顕微鏡
Author (3)：
NONNENMACHER M

About NONNENMACHER M

(IBM, New York)

About IBM, New York

, 
O'BOYLE M P

About O'BOYLE M P

(IBM, New York)

About IBM, New York

, 
WICKRAMASINGHE H K

About WICKRAMASINGHE H K

(IBM, New York)

About IBM, New York


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 58  Issue： 25  Page： 2921-2923  Publication year： Jun. 24, 1991 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
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contact potential difference

About contact potential difference

,...
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JST classification (1)：
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Microscopy determination of structures 
(BK01040E)

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Kelvinプローブ力顕微鏡

About Kelvinプローブ力顕微鏡


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