Art
J-GLOBAL ID：200902011583171456   Reference number：89A0129888

Multiple distributions for biased random test patterns.

重みづけしたランダムテストパタンのための多重分布
Author (1)：
WUNDERLICH H-J

About WUNDERLICH H-J

(Univ. Karlsruhe, Karlsruhe, DEU)

About Univ. Karlsruhe, Karlsruhe, DEU


Material：
Proceedings. International Test Conference  (Proc Int Test Conf)

About Proceedings. International Test Conference


Volume： 1988  Page： 236-244  Publication year： 1988 
JST Material Number： E0211B  ISSN： 1089-3539  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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test pattern

About test pattern

,...
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JST classification (1)：
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Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

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Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
重みづけ

About 重みづけ

, 
テストパタン

About テストパタン

, 
多重

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, 
分布

About 分布


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