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J-GLOBAL ID:200902012692437365   Reference number:92A0272898

Effects of Doposition Temperature on Strain in Polycrystalline SiC Films Deposited by Radio-Frequency Glow Discharge.

ラジオ周波数のグロー放電によって堆積させた多結晶SiC膜中のひずみに及ぼす堆積温度の効果
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Volume: 31  Issue: 3B  Page: L306-L308  Publication year: Mar. 15, 1992 
JST Material Number: F0599B  ISSN: 0021-4922  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Semiconductor thin films 
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