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J-GLOBAL ID：200902013694622042   Reference number：86A0320562

Trace element determination using synchrotron radiation.

シンクロトロン放射を利用するこん跡量元素の定量
Author (3)：
GIAUQUE R D

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(Univ. California)

About Univ. California

, 
JAKLEVIC J M

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(Univ. California)

About Univ. California

, 
THOMPSON A C

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(Univ. California)

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Material：
Analytical Chemistry  (Anal Chem)

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Volume： 58  Issue： 4  Page： 940-944  Publication year： Apr. 1986 
JST Material Number： A0395A  ISSN： 0003-2700  CODEN： ANCHAM  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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X-ray fluorescence analysis

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,...
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Other phsical analysis 
(CC03014E)

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Terms in the title (4)：
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シンクロトロン放射

About シンクロトロン放射

, 
こん跡

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, 
元素

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, 
定量

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