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J-GLOBAL ID：200902016340571318   Reference number：91A0772305

Characterization of epitaxially grown films of vanadium oxides.

酸化バナジウムのエピタキシャル成長膜の特性評価
Author (3)：
ROGERS K D

About ROGERS K D

(Cranfield Inst. Technology (RMCS), Wiltshire, GBR)

About Cranfield Inst. Technology (RMCS), Wiltshire, GBR

, 
COATH J A

About COATH J A

(Cranfield Inst. Technology (RMCS), Wiltshire, GBR)

About Cranfield Inst. Technology (RMCS), Wiltshire, GBR

, 
LOVELL M C

About LOVELL M C

(Cranfield Inst. Technology (RMCS), Wiltshire, GBR)

About Cranfield Inst. Technology (RMCS), Wiltshire, GBR


Material：
Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)

About Journal of Applied Physics


Volume： 70  Issue： 3  Page： 1412-1415  Publication year： Aug. 01, 1991 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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vanadium oxide

About vanadium oxide

,...
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JST classification (1)：
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Semiconductor thin films 
(BK14040E)

About Semiconductor thin films

Terms in the title (3)：
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Keywords automatically extracted from the title.
酸化バナジウム

About 酸化バナジウム

, 
エピタキシャル成長

About エピタキシャル成長

, 
特性評価

About 特性評価


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