Art
J-GLOBAL ID：200902019313453183   Reference number：90A0246479

Fault diagnosis of RAM’s from random testing experiments.

ランダム試験の実験からのRAMの故障診断
Author (2)：
DAVID R

About DAVID R

(Inst. National Polytechnique de Grenoble, Saint-Martin-d’Heres, FRA)

About Inst. National Polytechnique de Grenoble, Saint-Martin-d’Heres, FRA

, 
FUENTES A

About FUENTES A

(Inst. National Polytechnique de Grenoble, Saint-Martin-d’Heres, FRA)

About Inst. National Polytechnique de Grenoble, Saint-Martin-d’Heres, FRA


Material：
IEEE Transactions on Computers  (IEEE Trans Comput)

About IEEE Transactions on Computers


Volume： 39  Issue： 2  Page： 220-229  Publication year： Feb. 1990 
JST Material Number： C0233A  ISSN： 0018-9340  CODEN： ICTOB4  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
fault diagnosis

About fault diagnosis

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=90A0246479&from=J-GLOBAL&jstjournalNo=C0233A") }}
JST classification (1)：
JST classification
Category name(code) classified by JST.
Computer system development 
(JD02010R)

About Computer system development

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
ランダム試験

About ランダム試験

, 
実験

About 実験

, 
RAM

About RAM

, 
故障診断

About 故障診断


Return to Previous Page

TOP

BOTTOM