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J-GLOBAL ID:200902023262836314   Reference number:90A0475440

Simlation of scanning tunneling microscopy/spectroscopy based on electronic states theory.

電子状態理論による走査トンネル顕微鏡/分光のシミュレーション
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Material:
Volume: 25  Issue:Page: 337-345  Publication year: May. 1990 
JST Material Number: F0158B  ISSN: 0454-4544  CODEN: KOTBA2  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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界面の電気的性質一般【’81~’92】  ,  Electron and ion microscopes 
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