Art
J-GLOBAL ID：200902024347379571   Reference number：90A0012642

Electrical properties and detection methods for CMOS IC defects.

CMOS ICの欠陥の電気的特性とその検出方法
Author (2)：
SODEN J M

About SODEN J M

(Sandia National Lab., NM, USA)

About Sandia National Lab., NM, USA

, 
HAWKINS C F

About HAWKINS C F

(Univ. New Mexico, NM)

About Univ. New Mexico, NM


Material：
Proceedings of the 1st European Test Conference, 1989  (Proc 1st Eur Test Conf 1989)

About Proceedings of the 1st European Test Conference, 1989


Page： 159-167  Publication year： 1989 
JST Material Number： K19890452  ISBN： 0-8186-1937-6  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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CMOS structure

About CMOS structure

,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (5)：
Terms in the title
Keywords automatically extracted from the title.
CMOS

About CMOS

, 
IC

About IC

, 
欠陥

About 欠陥

, 
電気的特性

About 電気的特性

, 
検出方法

About 検出方法


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