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J-GLOBAL ID:200902024804773043   Reference number:91A0714148

Spectroscopic Charge Pumping: A New Procedure for Measuring Interface Trap Distributions on MOS Transistors.

分光器による電荷ポンピング MOSトランジスタの界面トラップ分布を測定するための新方法
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Material:
Volume: 38  Issue:Page: 1820-1831  Publication year: Aug. 1991 
JST Material Number: C0222A  ISSN: 0018-9383  CODEN: IETDAI  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Transistors  ,  Electronic structure of impurites and defects 
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