Art
J-GLOBAL ID：200902026132267660   Reference number：84A0172093

Testing for bridging faults (shorts) in CMOS circuits.

CMOS回路におけるブリッジ故障(短路)の検査
Author (1)：
ACKEN J M

About ACKEN J M

(Sandia National Lab., New Mexico)

About Sandia National Lab., New Mexico


Material：
Proceedings of the Design Automation Conference  (Proc Des Autom Conf)

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Volume： 20th  Page： 717-718  Publication year： 1983 
JST Material Number： D0553A  ISSN： 0738-100X  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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fault diagnosis

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,...
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JST classification (1)：
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Measurement,testing and reliability of solid-state devices 
(NC03040G)

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Terms in the title (3)：
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CMOS回路

About CMOS回路

, 
ブリッジ故障

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, 
検査

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