A cross-section TEM study of the microstructural evolution of CoPtCr/Cr thin films and the effect on magnetic properties.

PARKER M A; JOHNSON K E; HWANG C; BERMEA A

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J-GLOBAL ID：200902027396996453 Reference number：92A0198719

A cross-section TEM study of the microstructural evolution of CoPtCr/Cr thin films and the effect on magnetic properties.

CoPtCr/Cr薄膜の微小組織発生について断面TEMの研究と磁性への影響

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Volume： 27 Issue： 6 Pt 2 Page： 4730-4732 Publication year： Nov. 1991
JST Material Number： A0339B ISSN： 0018-9464 CODEN： IEMGAQ Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Electronic recording,magnetic recording,optical recording

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