An assessment of the structural models for amorphous SiO using MAS NMR.

DUPREE R; HOLLAND D; WILLIAMS D S

Art

J-GLOBAL ID：200902027566821033 Reference number：85A0026630

An assessment of the structural models for amorphous SiO using MAS NMR.

MAS NMRを用いたアモルファスSiOの構造模型の評価

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Author (3)： , ,
Material：
Volume： 50 Issue： 3 Page： L13-L18 Publication year： Sep. 1984
JST Material Number： H0004B ISSN： 1364-2812 CODEN： PMABDJ Document type： Article
Article type：短報 Country of issue： United Kingdom (GBR) Language： ENGLISH (EN)

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Structure of amorphous semiconductors , Structure of other amorphous materials , NMR of other inorganic compounds

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