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J-GLOBAL ID：200902028320875432
Reference number：92A0684649
Characterization of microporous Si by flow calorimetry: Comparison with a hydrophobic SiO2 molecular sieve.
流れ熱量測定法による微小多孔質けい素の特性評価 疎水性SiO2分子ふるいとの比較
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Author (2)：
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Material：
Volume：
72
Issue：
4
Page：
1558-1565
Publication year：
Aug. 15, 1992
JST Material Number：
C0266A
ISSN：
0021-8979
CODEN：
JAPIAU
Document type：
Article
Article type：
原著論文
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Surface structure of semiconductors
Terms in the title (8)：
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