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J-GLOBAL ID:200902028828646420   Reference number:88A0124821

On delay fault testing in logic circuits.

論理回路における遅延故障検査
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Volume:Issue:Page: 694-703  Publication year: Sep. 1987 
JST Material Number: B0142C  ISSN: 0278-0070  CODEN: ITCSDI  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Logic circuits 
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