Art
J-GLOBAL ID：200902032647122869   Reference number：83A0105455

Metal migration in electronic components.

電子部品における金属マイグレーション
Author (2)：
KAWANOBE T

About KAWANOBE T

(Hitachi Ltd., Tokyo)

About Hitachi Ltd., Tokyo

, 
OTSUKA K

About OTSUKA K

(Hitachi Ltd., Tokyo)

About Hitachi Ltd., Tokyo


Material：
Electronic Components Conference  (Electron Compon Conf)

About Electronic Components Conference


Volume： 32nd  Page： 220-228  Publication year： 1982 
JST Material Number： H0393A  CODEN： PECCA  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
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All keywords is available on JDreamIII(charged).
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semiconductor integrated circuit

About semiconductor integrated circuit

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
migration

About migration


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JST classification (3)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

,  Manufacturing technology of solid-state devices 
(NC03030V)

About Manufacturing technology of solid-state devices

,  Diffusion in metals 
(BL06022C)

About Diffusion in metals

Terms in the title (2)：
Terms in the title
Keywords automatically extracted from the title.
電子部品

About 電子部品

, 
マイグレーション

About マイグレーション


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