Art
J-GLOBAL ID：200902033595386192   Reference number：90A0679965

Outline of a spherically corrected semiaplanatic medium-voltage transmission electron microscope.

球面収差を補正した半アプラナティックで中程度の加速電圧をもつ透過電子顕微鏡の概要
Author (1)：
ROSE H

About ROSE H

(Technische Hochschule Darmstadt, DEU)

About Technische Hochschule Darmstadt, DEU


Material：
Optik  (International Journal for Light and Electron Optics)

About Optik


Volume： 85  Issue： 1  Page： 19-24  Publication year： Jun. 1990 
JST Material Number： D0251A  ISSN： 0030-4026  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)
Thesaurus term：
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All keywords is available on JDreamIII(charged).
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electron microscope

About electron microscope

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
aplanatism

About aplanatism


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JST classification (1)：
JST classification
Category name(code) classified by JST.
Electron lens,electron energy analysers 
(BD02040Q)

About Electron lens,electron energy analysers

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
球面収差

About 球面収差

, 
加速電圧

About 加速電圧

, 
透過電子顕微鏡

About 透過電子顕微鏡

, 
概要

About 概要


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